ESD REQUEST FORM
1516 Montague Expressway, San Jose -  CA 95131
Tel: (408) 955-9505 Fax: (408) 955-9599
Technical Sales: sales@icenginc.com General Information: info@icenginc.com
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1. Company Information:
Company:
Contact name:
Telephone:
Fax:
P.O. Number:
E-mail:
Address:
City, State, Zip:
Part Number:
Pkg. Type:

2. Required Test & Standard: (If Other, please be specific "Required")
HBM Mil Std. 883. Method 3015.7 Spec. MM JEDEC std. JESD22-AI15-A SDec.
HBM JEDEC Std. JESD22-AI14-A Spec. HBM EOS/ESD-S51.1-1993 spec.
Customer Test.
If other,
Note: Innovative Circuits Engineering strongly recommends using the JEDEC standard for testing. It is a much current specification than the Mil Standard, and is the standard the industry is moving towards.

3. Number of Device Pins: (includes no connections)

4. Number of No Connection Pins:

5. We normally connect all Vdd pins on one bus unless specified otherwise. Please indicate Vdd type pins or pin groups that require to be tied separately:


Note: Multiple Vdd busses dramatically increases the test time and the number of times each pin will be zapped. It also increase the cost and cycle time.

6. Single zap voltage level or  Multiple zap voltage level (please select one)

Note: Zapping can produce cumulative damage to the device. Innovative Circuits Engineering; therefore recommends that devices be zapped at a single voltage for qualification.

7. For Single zap voltage level: Please specify the voltage and/or the number of devices for each voltage. (normally used three devices for each voltage step):

8. For Multiple zap voltage level:

Start Voltage:		 Please specify:
End Voltage:
Voltage increment between steps:

9. Are both polarities required?  Yes    No  (typically yes).

10. Is curved tracing of the pins required to determine pass/fail? Yes    No

Note: If curve tracing is required it should only be used as an indication that the pin I/V characteristics have changed. Curve tracing should NEVER be used in defining pass/fail criteria for qualification of a device. Both Mil Std. and JEDEC specify that only electrical test be used to determine whether the device has passed ESD testing.

11. If curve trace is required, please specify:
  • Force current/voltage to:
 		(mA) ( V )
  • Limit current/voltage to:
 		(mA) ( V )
  • What is the fail criteria?
 		%
Innovative Circuits Engineering, Inc. normally uses >10% change in the I/V characteristic as the fail criteria.

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