1.
Company Information: (Fields
with this mark '*' are required)
*
E-mail:
*
Address:
*
City,
State, Zip:
Part
Number:
Pkg.
Type:
2. Required Test & Standard:
(If
Other, please be specific "Required")
HBM:
MIL-STD-883. Method 3015
MM:
JEDEC-STD JESD22-A115
HBM
JEDEC-STD JESD22-A114
HBM:
EOS/ESD-S51
Customer
Test.
If
other,
Note:
Innovative
Circuits Engineering strongly recommends using the JEDEC
standard for testing. It is a much current specification than
the Mil Standard, and is the standard the industry is moving
towards.
3. Number of
Device Pins:
(includes
no connections)
4. Number of
No Connection Pins:
5.
We normally connect all Vdd pins on one bus unless specified
otherwise. Please indicate Vdd type pins or pin groups that
require to be tied separately:
Note:
Multiple Vdd
busses dramatically increases the test time and the number of
times each pin will be zapped. It also increase the cost and
cycle time.
6.
Single
zap voltage level or Multiple zap
voltage level (please select one)
Note:
Zapping can
produce cumulative damage to the device. Innovative Circuits
Engineering; therefore recommends that devices be zapped at a
single voltage for qualification.
7. For Single
zap voltage level: Please
specify the voltage and/or the number of devices for each
voltage. (normally used three devices for each voltage step):
8. For Multiple
zap voltage level:
Start
Voltage:
Please
specify:
End
Voltage:
Voltage
increment between steps:
9. Are both polarities required?
Yes
No(typically
yes).
10.
Is curved tracing of the pins required to determine pass/fail?
Yes
No
Note:
If curve
tracing is required it should only be used as an indication that
the pin I/V characteristics have changed. Curve tracing should
NEVER be used in defining pass/fail criteria for qualification
of a device. Both Mil Std. and JEDEC specify that only
electrical test be used to determine whether the device has
passed ESD testing.
11.
If curve trace is required, please specify:
Force
current/voltage to:
(mA)
(
V )
Limit
current/voltage to:
(mA)
(
V )
What is
the fail criteria?
%
Innovative
Circuits Engineering, Inc. normally uses >10% change in the
I/V characteristic as the fail criteria.
