WE PROVIDE A WIDE RANGE OF SERVICES: Failure Analysis ESD and Latch-up Testing   Preconditioning Per JEDEC-A113, All Levels Low Temperature Burn-in ESD and Latch-up Testing Acoustic Analysis (C-Scan)    Solderability    Lead Integrity    Mark Permanency    Real Time X-Ray Electrical Test Capability For Memory Devices High Temperature Operating Life Temperature Humidity Bias Testing Highly Accelerated Stress Bias (HAST) Testing High Temperature Storage Autoclave (Pressure Cooker) Testing Temperature Cycling Thermal Shock Vapor Phase/Air Convection simulation Failure Analysis  I  ESD & Latch-up  I  Real Time X-Ray  I  Our Equipment   I  Quality News Letter  I  Jobs  I  Contact Us  I  Location  I  Home Innovative Circuits Engineering, Inc. is committed to providing our customers services and products with highest quality and on time delivery. © 1991-2001 Innovative Circuits Engineering, Inc. All Rights Reserved. Website Designed By VietNetCenter.com